Formal & Physical Sciences Engineering & TechnologyEN2025 L4: Electronic Devices: How They Operate and Are Fabricated/Defects, Contaminants, Yields(1)Tian-Li Wu (吳添立)September 23, 2025 152 min★ ★ ★ ★ ☆ 4/5SemiconductorMOSFETBand Theory
Applied Sciences & Engineering Engineering & TechnologyEN[2025 short course] 5-2: GaN BTI/TDDB/Switching/CGD/CGS & SiC TDDBProf. Tian-Li Wu (National Yang Ming Chiao Tung University)September 21, 2025 18 min★ ★ ★ ★ ☆ 4/5GaNSiCReliability
Applied Sciences & Engineering Engineering & TechnologyEN2025 L3: An Overview of Electronic Devices and Their Reliability (2)Tian-Li WuSeptember 15, 2025 152 min★ ★ ★ ★ ☆ 4/5Semiconductor ReliabilityFailure MechanismsArrhenius Equation
Applied Sciences & Engineering Engineering & TechnologyEN2025 L2: Introduction (2) /An Overview of Electronic Devices and Their Reliability (1)Tian-Li WuSeptember 8, 2025 149 min★ ★ ★ ★ ☆ 4/5SemiconductorReliabilityMoore's Law
Applied Sciences & Engineering Engineering & TechnologyEN[2025 short course] 5-1: Wide bandgap GaN & SiC/ GaN OFF-state reliabilityProf. Tian-Li WuSeptember 7, 2025 18 min★ ★ ★ ★ ☆ 4/5GaNSiCReliability
Applied Sciences & Engineering Engineering & TechnologyEN2025 L1: Introduction_半導體元件可靠度及其失效物理 Reliability and Failure Physics of Semiconductor DevicesTian-Li WuSeptember 1, 2025 165 min★ ★ ★ ★ ☆ 4/5SemiconductorReliabilityFailure Physics
Applied Sciences & Engineering Engineering & TechnologyEN[2025 short course] 4-2: Hot Carrier Injection/ Charge Detection/ Bias Temperature InstabilityProf. Tian-Li Wu (National Yang Ming Chiao Tung University)August 24, 2025 11 min★ ★ ★ ★ ☆ 4/5Semiconductor ReliabilityHot Carrier InjectionBias Temperature Instability